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Strong-field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling
Molecular depth profiles of an organic thin film of guanine vapor deposited onto a Ag substrate are obtained using a 40 keV C(60) cluster ion beam in conjunction with time-of-flight secondary ion mass spectrometric (ToF-SIMS) detection. Strong-field, femtosecond photoionization of intact guanine mol...
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| 主要な著者: | , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2010
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2873046/ https://ncbi.nlm.nih.gov/pubmed/20495665 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/jp9054632 |
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