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High-resolution low-dose scanning transmission electron microscopy
During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electr...
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| Hauptverfasser: | , , , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
Oxford University Press
2010
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2857930/ https://ncbi.nlm.nih.gov/pubmed/19915208 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfp052 |
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