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High-resolution low-dose scanning transmission electron microscopy

During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electr...

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Podrobná bibliografie
Hlavní autoři: Buban, James P., Ramasse, Quentin, Gipson, Bryant, Browning, Nigel D., Stahlberg, Henning
Médium: Artigo
Jazyk:Inglês
Vydáno: Oxford University Press 2010
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC2857930/
https://ncbi.nlm.nih.gov/pubmed/19915208
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1093/jmicro/dfp052
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