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Low-dose aberration corrected cryo-electron microscopy of organic specimens

Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose...

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Detalhes bibliográficos
Main Authors: Evans, James E., Hetherington, Crispin, Kirkland, Angus, Chang, Lan-Yun, Stahlberg, Henning, Browning, Nigel
Formato: Artigo
Idioma:Inglês
Publicado em: 2008
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC2758313/
https://ncbi.nlm.nih.gov/pubmed/18703285
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2008.06.004
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