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Low-dose aberration corrected cryo-electron microscopy of organic specimens
Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose...
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| Auteurs principaux: | , , , , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
2008
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| Sujets: | |
| Accès en ligne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2758313/ https://ncbi.nlm.nih.gov/pubmed/18703285 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2008.06.004 |
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