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Low-dose aberration corrected cryo-electron microscopy of organic specimens
Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose...
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| 主要な著者: | , , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2008
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2758313/ https://ncbi.nlm.nih.gov/pubmed/18703285 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2008.06.004 |
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