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Freeze-Etching and Vapor Matrix Deposition for ToF-SIMS Imaging of Single Cells
Freeze-etching, the practice of removing excess surface water from a sample through sublimation into the vacuum of the analysis environment, has been extensively used in conjunction with electron microscopy. Here, we apply this technique to time-of-flight secondary-ion mass spectrometry (ToF-SIMS) i...
में बचाया:
| मुख्य लेखकों: | , , , , , , |
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| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
2008
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2527754/ https://ncbi.nlm.nih.gov/pubmed/18570446 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/la800292e |
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