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Freeze-Etching and Vapor Matrix Deposition for ToF-SIMS Imaging of Single Cells

Freeze-etching, the practice of removing excess surface water from a sample through sublimation into the vacuum of the analysis environment, has been extensively used in conjunction with electron microscopy. Here, we apply this technique to time-of-flight secondary-ion mass spectrometry (ToF-SIMS) i...

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Detalhes bibliográficos
Main Authors: Piehowski, Paul D., Kurczy, Michael E., Willingham, David, Parry, Shawn, Heien, Michael L., Winograd, Nicholas, Ewing, Andrew G.
Formato: Artigo
Idioma:Inglês
Publicado em: 2008
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC2527754/
https://ncbi.nlm.nih.gov/pubmed/18570446
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/la800292e
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