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Imaging the Activity and Localization of Single Voltage-Gated Ca(2+) Channels by Total Internal Reflection Fluorescence Microscopy

The patch-clamp technique has enabled functional studies of single ion channels, but suffers limitations including lack of spatial information and inability to independently monitor currents from more than one channel. Here, we describe the use of total internal reflection fluorescence microscopy as...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Demuro, Angelo, Parker, Ian
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Biophysical Society 2004
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC1304190/
https://ncbi.nlm.nih.gov/pubmed/15111438
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