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Schottky Barrier Height Engineering of Ti/n-Type Silicon Diode by Means of Ion Implantation

Herein, boron implantation technique was employed to engineer the Schottky barrier height (SBH) of Ti/n-type silicon junction (Ti/n-Si). The Ti/n-Si Schottky diodes with boron doses of 4, 5.4 and 6.6´1012 cm-2 at the energy of 25 keV were fabricated with improved rectification and their effective SB...

Whakaahuatanga katoa

I tiakina i:
Ngā taipitopito rārangi puna kōrero
Ngā kaituhi matua: Doldet TANTRAVIWAT, Wittawat YAMWONG, Udom TECHAKIJKAJORN, Kazuo IMAI, Burapat INCEESUNGVORN
Hōputu: Artigo
Reo:Inglês
I whakaputaina: Walailak University 2018-11-01
Rangatū:Walailak Journal of Science and Technology
Ngā marau:
Urunga tuihono:http://wjst.wu.ac.th/index.php/wjst/article/view/5968
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