Study of Thick Film Resistors By 1/f Noise Measurements
Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.
Gorde:
| Egile Nagusiak: | , , , |
|---|---|
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Wiley
1989-01-01
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| Saila: | Active and Passive Electronic Components |
| Sarrera elektronikoa: | http://dx.doi.org/10.1155/1989/36201 |
| Etiketak: |
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