Study of Thick Film Resistors By 1/f Noise Measurements
Knowledge on the conduction mechanism of thick film resistors are limited and often contradictory.
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| Autori principali: | , , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Wiley
1989-01-01
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| Serie: | Active and Passive Electronic Components |
| Accesso online: | http://dx.doi.org/10.1155/1989/36201 |
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