Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
We investigated single-layer graphene on SiC(0001) by atomic force and tunneling current microscopy, to separate the topographic and electronic contributions from the overall landscape. The analysis revealed that the roughness evaluated from the atomic force maps is very low, in accord with theoreti...
Wedi'i Gadw mewn:
| Prif Awduron: | , , , , |
|---|---|
| Fformat: | Artigo |
| Iaith: | Inglês |
| Cyhoeddwyd: |
Beilstein-Institut
2015-04-01
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| Cyfres: | Beilstein Journal of Nanotechnology |
| Pynciau: | |
| Mynediad Ar-lein: | https://doi.org/10.3762/bjnano.6.93 |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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