Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature
We investigated single-layer graphene on SiC(0001) by atomic force and tunneling current microscopy, to separate the topographic and electronic contributions from the overall landscape. The analysis revealed that the roughness evaluated from the atomic force maps is very low, in accord with theoreti...
Kaydedildi:
| Asıl Yazarlar: | , , , , |
|---|---|
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Beilstein-Institut
2015-04-01
|
| Seri Bilgileri: | Beilstein Journal of Nanotechnology |
| Konular: | |
| Online Erişim: | https://doi.org/10.3762/bjnano.6.93 |
| Etiketler: |
Etiket eklenmemiş, İlk siz ekleyin!
|