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Compact Modeling of Surface Potential, Drain Current and Terminal Charges in Negative Capacitance Nanosheet FET including Quasi-Ballistic Transport

In this article, we propose a compact model for Negative Capacitance Nanosheet Field Effect Transistor (NC-NSFET) including quasi-ballistic transport for sub-7nm technology node. The model captures the electrical characteristics of NC-NSFET for different ferroelectric thicknesses. Further, it captur...

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Bibliografiske detaljer
Principais autores: Amol D. Gaidhane, Girish Pahwa, Avirup Dasgupta, Amit Verma, Yogesh Singh Chauhan
Format: Artigo
Sprog:Inglês
Udgivet: IEEE 2020-01-01
Serier:IEEE Journal of the Electron Devices Society
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Online adgang:https://ieeexplore.ieee.org/document/9178797/
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