Codice QR

Compact Modeling of Surface Potential, Drain Current and Terminal Charges in Negative Capacitance Nanosheet FET including Quasi-Ballistic Transport

In this article, we propose a compact model for Negative Capacitance Nanosheet Field Effect Transistor (NC-NSFET) including quasi-ballistic transport for sub-7nm technology node. The model captures the electrical characteristics of NC-NSFET for different ferroelectric thicknesses. Further, it captur...

Descrizione completa

Salvato in:
Dettagli Bibliografici
Autori principali: Amol D. Gaidhane, Girish Pahwa, Avirup Dasgupta, Amit Verma, Yogesh Singh Chauhan
Natura: Artigo
Lingua:Inglês
Pubblicazione: IEEE 2020-01-01
Serie:IEEE Journal of the Electron Devices Society
Soggetti:
Accesso online:https://ieeexplore.ieee.org/document/9178797/
Tags: Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne!!