Compact Single-Shot Dual-Wavelength Interferometry for Large Object Measurement with Rough Surfaces
Single-shot dual-wavelength interferometry offers a promising avenue for surface profile measurement of dynamic objects. However, current techniques employing pixel multiplexing or color cameras encounter challenges such as complex optical alignment, limited measurement range, and difficulty in meas...
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| Autors principals: | , , , , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI AG
2024-05-01
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| Col·lecció: | Photonics |
| Matèries: | |
| Accés en línia: | https://www.mdpi.com/2304-6732/11/6/518 |
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