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Direct Visualization of Charge Migration in Bilayer Tantalum Oxide Films by Multimodal Imaging

Abstract Inspired by biological neuromorphic computing, artificial neural networks based on crossbar arrays of bilayer tantalum oxide memristors have shown to be promising alternatives to conventional complementary metal‐oxide‐semiconductor (CMOS) architectures. In order to understand the driving me...

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Hoofdauteurs: Matthew Flynn‐Hepford, John Lasseter, Ivan Kravchenko, Steven Randolph, Jong Keum, Bobby G. Sumpter, Stephen Jesse, Petro Maksymovych, A. Alec Talin, Matthew J. Marinella, Philip D. Rack, Anton V. Ievlev, Olga S. Ovchinnikova
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: Wiley-VCH 2024-01-01
Reeks:Advanced Electronic Materials
Onderwerpen:
memristors
ReRAM
tantalum oxide
Online toegang:https://doi.org/10.1002/aelm.202300589
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