High-Throughput Micro-Combinatorial TEM Phase Mapping of the DC Magnetron Sputtered Y<sub>x</sub>Ti<sub>1−x</sub>O<sub>y</sub> Thin Layer System
High-throughput methods are extremely important in today’s materials science, especially in the case of thin film characterization. The micro-combinatorial method enables the deposition and characterization of entire multicomponent thin film systems within a single sample. In this paper, we report t...
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| Principais autores: | , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI AG
2024-05-01
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| coleção: | Nanomaterials |
| Assuntos: | |
| Acesso em linha: | https://www.mdpi.com/2079-4991/14/11/925 |
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