High Conversion-Gain Pinned-Photodiode Pump-Gate Pixels in 180-nm CMOS Process
This paper presents the design and characterization of high conversion-gain pixels in a 180-nm CMOS image sensor process. By reducing overlapping capacitance between a floating diffusion and transfer gate, output-referred pixel conversion gain as high as 118uV/eand read noise as low as 1.8erms are e...
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| Auteurs principaux: | , , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
IEEE
2017-01-01
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| Collection: | IEEE Journal of the Electron Devices Society |
| Sujets: | |
| Accès en ligne: | https://ieeexplore.ieee.org/document/8047441/ |
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