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Tribological Study on Photocatalysis-Assisted Chemical Mechanical Polishing of SiC

Silicon carbide (SiC) is widely used as a power semiconductor substrate material, even if it takes a large amount of processing time to secure an appropriate surface as a wafer for devices after chemical mechanical polishing (CMP). Therefore, studies on SiC CMP have focused on shortening the process...

Täydet tiedot

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Bibliografiset tiedot
Päätekijä: Hyunseop Lee
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: MDPI AG 2023-05-01
Sarja:Lubricants
Aiheet:
Linkit:https://www.mdpi.com/2075-4442/11/5/229
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