Structural and Electrical Properties of Annealed Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> Films Grown on Flexible Polyimide
The morphological, structural, and electrical properties of as-grown and annealed Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> (GST) layers, deposited by RF-sputtering on flexible polyimide, were studied by means of optical microscopy, atomic force microscopy, X-ray diffraction, Raman spectroscopy, an...
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| Asıl Yazarlar: | , , , , , , , , |
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| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
MDPI AG
2022-06-01
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| Seri Bilgileri: | Nanomaterials |
| Konular: | |
| Online Erişim: | https://www.mdpi.com/2079-4991/12/12/2001 |
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