Structural and Electrical Properties of Annealed Ge₂Sb₂Te₅ Films Grown on Flexible Polyimide

The morphological, structural, and electrical properties of as-grown and annealed Ge₂Sb₂Te₅ (GST) layers, deposited by RF-sputtering on flexible polyimide, were studied by means of optical microscopy, atomic force microscopy, X-ray diffraction, Raman spectroscopy, an...

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主要な著者:	Marco Bertelli, Adriano Díaz Fattorini, Sara De Simone, Sabrina Calvi, Riccardo Plebani, Valentina Mussi, Fabrizio Arciprete, Raffaella Calarco, Massimo Longo
フォーマット:	Artigo
言語:	Inglês
出版事項:	MDPI AG 2022-06-01
シリーズ:	Nanomaterials
主題:	PCM Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> sputtering flexible substrates crystallization electrical properties
オンライン･アクセス:	https://www.mdpi.com/2079-4991/12/12/2001
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