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Field plate multi-finger diamond MOSFET with ampere-class current capability and a breakdown voltage of 550 V

The field plate structure is an effective technique for improving breakdown characteristics. In this work, the gate field plate (GFP) diamond MOSFET with both ampere-class current capability and high breakdown voltage is demonstrated for the first time. The maximum drain current of the fabricated de...

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Autors principals: S. Shoji, N. Oi, S. Kawai, R. Yoshida, K. Ota, A. Watanabe, I. Omura, K. Ueda, T. Fujishima
Format: Artigo
Idioma:Inglês
Publicat: IOP Publishing 2026-01-01
Col·lecció:Applied Physics Express
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Accés en línia:https://doi.org/10.35848/1882-0786/ae49df
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