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2D mapping of plane stress crack-tip fields following an overload

The evolution of crack-tip strain fields in a thin (plane stress) compact tension sample following an overload (OL) event has been studied using two different experimental techniques. Surface behaviour has been characterised by Digital Image Correlation (DIC), while the bulk behaviour has been cha...

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Détails bibliographiques
Auteurs principaux: P. J. Withers, P. Lopez-Crespo, M. Mostafavi, A. Steuwer, J. F. Kelleher, T. Buslaps
Format: Artigo
Langue:Inglês
Publié: Gruppo Italiano Frattura 2015-07-01
Collection:Fracture and Structural Integrity
Sujets:
Accès en ligne:http://www.gruppofrattura.it/pdf/rivista/numero33/numero_33_art_19.pdf
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