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2D mapping of plane stress crack-tip fields following an overload

The evolution of crack-tip strain fields in a thin (plane stress) compact tension sample following an overload (OL) event has been studied using two different experimental techniques. Surface behaviour has been characterised by Digital Image Correlation (DIC), while the bulk behaviour has been cha...

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書誌詳細
主要な著者: P. J. Withers, P. Lopez-Crespo, M. Mostafavi, A. Steuwer, J. F. Kelleher, T. Buslaps
フォーマット: Artigo
言語:Inglês
出版事項: Gruppo Italiano Frattura 2015-07-01
シリーズ:Fracture and Structural Integrity
主題:
オンライン・アクセス:http://www.gruppofrattura.it/pdf/rivista/numero33/numero_33_art_19.pdf
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