Código QR (código de barras bidimensional)

2D mapping of plane stress crack-tip fields following an overload

The evolution of crack-tip strain fields in a thin (plane stress) compact tension sample following an overload (OL) event has been studied using two different experimental techniques. Surface behaviour has been characterised by Digital Image Correlation (DIC), while the bulk behaviour has been cha...

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Principais autores: P. J. Withers, P. Lopez-Crespo, M. Mostafavi, A. Steuwer, J. F. Kelleher, T. Buslaps
格式: Artigo
語言:Inglês
出版: Gruppo Italiano Frattura 2015-07-01
叢編:Fracture and Structural Integrity
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在線閱讀:http://www.gruppofrattura.it/pdf/rivista/numero33/numero_33_art_19.pdf
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