2D mapping of plane stress crack-tip fields following an overload
The evolution of crack-tip strain fields in a thin (plane stress) compact tension sample following an overload (OL) event has been studied using two different experimental techniques. Surface behaviour has been characterised by Digital Image Correlation (DIC), while the bulk behaviour has been cha...
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| Главные авторы: | , , , , , |
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| Формат: | Artigo |
| Язык: | Inglês |
| Опубликовано: |
Gruppo Italiano Frattura
2015-07-01
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| Серии: | Fracture and Structural Integrity |
| Предметы: | |
| Online-ссылка: | http://www.gruppofrattura.it/pdf/rivista/numero33/numero_33_art_19.pdf |
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