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Automated Endurance Characterization of Phase Change Memory

Phase change memory cells are outstanding candidates for processing-in-memory and neuromorphic computing. The high endurance, low cycle-to-cycle variability, and low read noise especially suit many applications, whereas the high cell-to-cell variability poses a challenge, since each cell serves slig...

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Principais autores: Henriette Padberg, Abbas Espiari, Kristoffer Schnieders, Alexander Kiehn, Abdur Rehman Jalil, Rainer Waser, Stephan Menzel, Stefan Wiefels
Formato: Artigo
Idioma:Inglês
Publicado: IEEE 2025-01-01
Series:IEEE Access
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Acceso en liña:https://ieeexplore.ieee.org/document/10969809/
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