Approaches for Memristive Structures Using Scratching Probe Nanolithography: Towards Neuromorphic Applications

This paper proposes two different approaches to studying resistive switching of oxide thin films using scratching probe nanolithography of atomic force microscopy (AFM). These approaches allow us to assess the effects of memristor size and top-contact thickness on resistive switching. For that purpo...

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Auteurs principaux:	Roman V. Tominov, Zakhar E. Vakulov, Vadim I. Avilov, Ivan A. Shikhovtsov, Vadim I. Varganov, Victor B. Kazantsev, Lovi Raj Gupta, Chander Prakash, Vladimir A. Smirnov
Format:	Artigo
Langue:	Inglês
Publié:	MDPI AG 2023-05-01
Collection:	Nanomaterials
Sujets:	artificial intelligence neuromorphic systems memristor ReRAM resistive switching scratching probe nanolithography
Accès en ligne:	https://www.mdpi.com/2079-4991/13/10/1583
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