Approaches for Memristive Structures Using Scratching Probe Nanolithography: Towards Neuromorphic Applications

This paper proposes two different approaches to studying resistive switching of oxide thin films using scratching probe nanolithography of atomic force microscopy (AFM). These approaches allow us to assess the effects of memristor size and top-contact thickness on resistive switching. For that purpo...

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Номзүйн дэлгэрэнгүй

Үндсэн зохиолчид:	Roman V. Tominov, Zakhar E. Vakulov, Vadim I. Avilov, Ivan A. Shikhovtsov, Vadim I. Varganov, Victor B. Kazantsev, Lovi Raj Gupta, Chander Prakash, Vladimir A. Smirnov
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	MDPI AG 2023-05-01
Цуврал:	Nanomaterials
Нөхцлүүд:	artificial intelligence neuromorphic systems memristor ReRAM resistive switching scratching probe nanolithography
Онлайн хандалт:	https://www.mdpi.com/2079-4991/13/10/1583
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!