Approaches for Memristive Structures Using Scratching Probe Nanolithography: Towards Neuromorphic Applications

This paper proposes two different approaches to studying resistive switching of oxide thin films using scratching probe nanolithography of atomic force microscopy (AFM). These approaches allow us to assess the effects of memristor size and top-contact thickness on resistive switching. For that purpo...

ver descrição completa

Detalhes bibliográficos

Principais autores:	Roman V. Tominov, Zakhar E. Vakulov, Vadim I. Avilov, Ivan A. Shikhovtsov, Vadim I. Varganov, Victor B. Kazantsev, Lovi Raj Gupta, Chander Prakash, Vladimir A. Smirnov
Formato:	Artigo
Idioma:	Inglês
Publicado em:	MDPI AG 2023-05-01
Colecção:	Nanomaterials
Assuntos:	artificial intelligence neuromorphic systems memristor ReRAM resistive switching scratching probe nanolithography
Acesso em linha:	https://www.mdpi.com/2079-4991/13/10/1583
Tags:	Adicionar Tag Sem tags, seja o primeiro a adicionar uma tag!