First-Principles Study of Cu Addition on Mechanical Properties of Ni<sub>3</sub>Sn<sub>4</sub>-Based Intermetallic Compounds
Ni–Cu under-bump metallisation (UBM) can reduce stress and improve wetting ability in technology for electronic packaging technology advances with three-dimensional integrated circuit (3D IC) devices. The bond between the Sn-based solder and Ni–Cu UBM is affected by the formation of intermetallic co...
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| Principais autores: | , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI AG
2024-01-01
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| coleção: | Metals |
| Assuntos: | |
| Acesso em linha: | https://www.mdpi.com/2075-4701/14/1/64 |
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