Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns

A dedicated transmission helium ion microscope (THIM) for sub-50 keV helium has been constructed to investigate ion scattering processes and contrast mechanisms, aiding the development of new imaging and analysis modalities. Unlike a commercial helium ion microscope (HIM), the in-house built instrum...

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Autors principals:	Michael Mousley, Santhana Eswara, Olivier De Castro, Olivier Bouton, Nico Klingner, Christoph T. Koch, Gregor Hlawacek, Tom Wirtz
Format:	Artigo
Idioma:	Inglês
Publicat:	Beilstein-Institut 2019-08-01
Col·lecció:	Beilstein Journal of Nanotechnology
Matèries:	charging helium ion microscopy ion diffraction ion scattering transmission ion microscopy
Accés en línia:	https://doi.org/10.3762/bjnano.10.160
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