Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns

A dedicated transmission helium ion microscope (THIM) for sub-50 keV helium has been constructed to investigate ion scattering processes and contrast mechanisms, aiding the development of new imaging and analysis modalities. Unlike a commercial helium ion microscope (HIM), the in-house built instrum...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй

Үндсэн зохиолчид:	Michael Mousley, Santhana Eswara, Olivier De Castro, Olivier Bouton, Nico Klingner, Christoph T. Koch, Gregor Hlawacek, Tom Wirtz
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	Beilstein-Institut 2019-08-01
Цуврал:	Beilstein Journal of Nanotechnology
Нөхцлүүд:	charging helium ion microscopy ion diffraction ion scattering transmission ion microscopy
Онлайн хандалт:	https://doi.org/10.3762/bjnano.10.160
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!