Scanning transmission helium ion microscopy on carbon nanomembranes
A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection principle is based on a secondary electron conversion holder with an exchangeable aperture strip allowing its acceptance angle to be tuned from 3 to 98 mrad. The contrast mechanism an...
Uloženo v:
| Hlavní autoři: | , , , , , |
|---|---|
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Beilstein-Institut
2021-02-01
|
| Edice: | Beilstein Journal of Nanotechnology |
| Témata: | |
| On-line přístup: | https://doi.org/10.3762/bjnano.12.18 |
| Tagy: |
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
|