On the Design and Implementation and Evaluation of Euclidean Geometry Quasi-Cyclic LDPC Codes for NAND Flash Memories

As data storage demands continue to grow, ensuring the reliability of NAND flash devices after a large number of Program/Erase (P/E) cycles have elapsed has become a critical requirement. With an addition in the number of Program/Erase (P/E) cycles in NAND flash devices, it is observed that there is...

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Hlavní autoři:	G. Achala, U. Shripathi Acharya, Pathipati Srihari, Linga Reddy Cenkeramaddi
Médium:	Artigo
Jazyk:	Inglês
Vydáno:	IEEE 2026-01-01
Edice:	IEEE Open Journal of the Communications Society
Témata:	Error control code memory device NAND flash LDPC codes QC-LDPC EG-LDPC
On-line přístup:	https://ieeexplore.ieee.org/document/11535461/
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