On the Design and Implementation and Evaluation of Euclidean Geometry Quasi-Cyclic LDPC Codes for NAND Flash Memories
As data storage demands continue to grow, ensuring the reliability of NAND flash devices after a large number of Program/Erase (P/E) cycles have elapsed has become a critical requirement. With an addition in the number of Program/Erase (P/E) cycles in NAND flash devices, it is observed that there is...
محفوظ في:
| المؤلفون الرئيسيون: | , , , |
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| التنسيق: | Artigo |
| اللغة: | Inglês |
| منشور في: |
IEEE
2026-01-01
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| سلاسل: | IEEE Open Journal of the Communications Society |
| الموضوعات: | |
| الوصول للمادة أونلاين: | https://ieeexplore.ieee.org/document/11535461/ |
| الوسوم: |
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