On the Design and Implementation and Evaluation of Euclidean Geometry Quasi-Cyclic LDPC Codes for NAND Flash Memories
As data storage demands continue to grow, ensuring the reliability of NAND flash devices after a large number of Program/Erase (P/E) cycles have elapsed has become a critical requirement. With an addition in the number of Program/Erase (P/E) cycles in NAND flash devices, it is observed that there is...
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| Auteurs principaux: | , , , |
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| Format: | Artigo |
| Langue: | Inglês |
| Publié: |
IEEE
2026-01-01
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| Collection: | IEEE Open Journal of the Communications Society |
| Sujets: | |
| Accès en ligne: | https://ieeexplore.ieee.org/document/11535461/ |
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