X-ray two-beam topography for quantitative derivation of phase shift by crystalline dislocations
Quantitative evaluation of crystalline dislocations is gaining importance in order to realize functional materials with ultimate performance. X-ray topography has been an important tool to evaluate the crystalline dislocations in bulk in a large volume, but the research up to now lacks the analysis...
שמור ב:
| Principais autores: | , , , , , , , , |
|---|---|
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
American Physical Society
2023-03-01
|
| סדרה: | Physical Review Research |
| גישה מקוונת: | http://doi.org/10.1103/PhysRevResearch.5.L012043 |
| תגים: |
אין תגיות, היה/י הראשונ/ה לתייג את הרשומה!
|
