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X-ray two-beam topography for quantitative derivation of phase shift by crystalline dislocations

Quantitative evaluation of crystalline dislocations is gaining importance in order to realize functional materials with ultimate performance. X-ray topography has been an important tool to evaluate the crystalline dislocations in bulk in a large volume, but the research up to now lacks the analysis...

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Principais autores: Yoshiki Kohmura, Kenji Ohwada, Nobuki Kakiuchi, Kei Sawada, Tadaaki Kaneko, Jun'ichiro Mizuki, Masaichiro Mizumaki, Tetsu Watanuki, Tetsuya Ishikawa
Format: Artigo
Jezik:Inglês
Izdano: American Physical Society 2023-03-01
Serija:Physical Review Research
Online dostop:http://doi.org/10.1103/PhysRevResearch.5.L012043
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