X-ray two-beam topography for quantitative derivation of phase shift by crystalline dislocations
Quantitative evaluation of crystalline dislocations is gaining importance in order to realize functional materials with ultimate performance. X-ray topography has been an important tool to evaluate the crystalline dislocations in bulk in a large volume, but the research up to now lacks the analysis...
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| Hlavní autoři: | , , , , , , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
American Physical Society
2023-03-01
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| Edice: | Physical Review Research |
| On-line přístup: | http://doi.org/10.1103/PhysRevResearch.5.L012043 |
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