Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100)
The<b> </b>focus of this work lies on investigations on a new Nano Fabrication Machine (NFM-100) with a mounted atomic force microscope (AFM). This installed tip-based measuring system uses self-sensing and self-actuated microcantilevers, which can be used especially for field-emission scanning prob...
I tiakina i:
| Ngā kaituhi matua: | , , , , , , , , , |
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| Hōputu: | Artigo |
| Reo: | Inglês |
| I whakaputaina: |
MDPI AG
2020-12-01
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| Rangatū: | Proceedings |
| Ngā marau: | |
| Urunga tuihono: | https://www.mdpi.com/2504-3900/56/1/34 |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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