Investigations on Long-Range AFM Scans Using a Nanofabrication Machine (NFM-100)
The<b> </b>focus of this work lies on investigations on a new Nano Fabrication Machine (NFM-100) with a mounted atomic force microscope (AFM). This installed tip-based measuring system uses self-sensing and self-actuated microcantilevers, which can be used especially for field-emission scanning prob...
Wedi'i Gadw mewn:
| Prif Awduron: | , , , , , , , , , |
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| Fformat: | Artigo |
| Iaith: | Inglês |
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MDPI AG
2020-12-01
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| Cyfres: | Proceedings |
| Pynciau: | |
| Mynediad Ar-lein: | https://www.mdpi.com/2504-3900/56/1/34 |
| Tagiau: |
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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