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A Novel Nitrogen Ion Implantation Technique for Turning Thin Film “Normally On” AlGaN/GaN Transistor into “Normally Off” Using TCAD Simulation

This study presents an innovative, low-cost, mass-manufacturable ion implantation technique for converting thin film normally on AlGaN/GaN devices into normally off ones. Through TCAD (Technology Computer-Aided Design) simulations, we converted a calibrated normally on transistor into a normally off...

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Principais autores: Gene Sheu, Yu-Lin Song, Dupati Susmitha, Kutagulla Issac, Ramyasri Mogarala
Formato: Artigo
Idioma:Inglês
Publicado: MDPI AG 2021-11-01
Series:Membranes
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Acceso en liña:https://www.mdpi.com/2077-0375/11/11/899
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