Through the Looking-Glass: Sensitive Data Extraction by Optical Probing of Scan Chains
There is an imminent trade-off between an Integrated Circuit (IC)’s testability and its physical security. While Design for Test (DfT) techniques, such as scan chains make the circuit’s physical behavior at runtime observable and easy to control, these techniques form a lucrative class of attack ve...
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| Principais autores: | , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Ruhr-Universität Bochum
2024-09-01
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| Colecção: | Transactions on Cryptographic Hardware and Embedded Systems |
| Assuntos: | |
| Acesso em linha: | https://tches.iacr.org/index.php/TCHES/article/view/11802 |
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