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Optically induced forces in scanning probe microscopy

Typical measurements of light in the near-field utilize a photodetector such as a photomultiplier tube or a photodiode, which is placed remotely from the region under test. This kind of detection has many draw-backs including the necessity to detect light in the far-field, the influence of backgroun...

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Principais autores: Kohlgraf-Owens Dana C., Sukhov Sergey, Greusard Léo, De Wilde Yannick, Dogariu Aristide
Format: Artigo
Sprog:Inglês
Udgivet: Wiley 2014-04-01
Serier:Nanophotonics
Fag:
scanning probe microscopy (spm)
near-field scanning optical microscopy (nsom)
scanning near-field optical microscopy (snom)
atomic force microscopy (afm)
kelvin probe force microscopy (kpfm)
near-field optics
optical forces
opto-mechanics
opto-mechanical resonator
Online adgang:https://doi.org/10.1515/nanoph-2013-0056
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