Through the Looking-Glass: Sensitive Data Extraction by Optical Probing of Scan Chains

There is an imminent trade-off between an Integrated Circuit (IC)’s testability and its physical security. While Design for Test (DfT) techniques, such as scan chains make the circuit’s physical behavior at runtime observable and easy to control, these techniques form a lucrative class of attack ve...

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Үндсэн зохиолчид:	Tuba Kiyan, Lars Renkes, Marvin Sass, Antonio Saavedra, Norbert Herfurth, Elham Amini, Jean-Pierre Seifert
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	Ruhr-Universität Bochum 2024-09-01
Цуврал:	Transactions on Cryptographic Hardware and Embedded Systems
Нөхцлүүд:	Hardware attacks Design for Testing Scan chains Optical Probing
Онлайн хандалт:	https://tches.iacr.org/index.php/TCHES/article/view/11802
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!