Electrical Properties and Thermal Annealing Effects of Polycrystalline MoS₂-MoS_X Nanowalls Grown by Sputtering Deposition Method

Straightforward growth of nanostructured low-bandgap materials is a key issue in mass production for electronic device applications. We report here facile nanowall growth of MoS₂-MoS_X using sputter deposition and investigate the electronic properties of the nanowalls. MoS<sub>2...

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Номзүйн дэлгэрэнгүй

Үндсэн зохиолчид:	Doo-Seung Um, Mi-Jin Jin, Jong-Chang Woo, Dong-Pyo Kim, Jungmin Park, Younghun Jo, Gwan-Ha Kim
Формат:	Artigo
Хэл сонгох:	Inglês
Хэвлэсэн:	MDPI AG 2021-03-01
Цуврал:	Crystals
Нөхцлүүд:	MoS<sub>2</sub> nanowall crystal growth sputter deposition MoS<sub>2</sub> polycrystal characterization
Онлайн хандалт:	https://www.mdpi.com/2073-4352/11/4/351
Шошгууд:	Шошго нэмэх Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!