Electrical Properties and Thermal Annealing Effects of Polycrystalline MoS<sub>2</sub>-MoS<sub>X</sub> Nanowalls Grown by Sputtering Deposition Method
Straightforward growth of nanostructured low-bandgap materials is a key issue in mass production for electronic device applications. We report here facile nanowall growth of MoS<sub>2</sub>-MoS<sub>X</sub> using sputter deposition and investigate the electronic properties of the nanowalls. MoS<sub>2...
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| Autors principals: | , , , , , , |
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| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
MDPI AG
2021-03-01
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| Col·lecció: | Crystals |
| Matèries: | |
| Accés en línia: | https://www.mdpi.com/2073-4352/11/4/351 |
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