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Performance Analysis of L-Shaped Cladding Layer-Based Dopingless TFET Including Interface Trap Charges and Temperatures

This work investigates the impact of temperature variation and interface trap charges (ITCs) on the DC, RF/analog, and linearity performance of an L-shaped cladding layer-based dopingless TFET (LCD-TFET) using TCAD simulations. Key parameters including band-to-band tunneling (BTBT) rate, transconduc...

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Autors principals: S. Shabareeshan, Srinidhi Balakrishnan, Shanidul Hoque, Rajesh Saha
Format: Artigo
Idioma:Inglês
Publicat: IEEE 2026-01-01
Col·lecció:IEEE Access
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Accés en línia:https://ieeexplore.ieee.org/document/11450363/
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