A Low-Power Read-Decoupled Radiation-Hardened 16T SRAM for Space Applications
Advancements in CMOS technology have significantly reduced both transistor dimensions and inter-device spacing, leading to a lower critical charge at sensitive nodes. As a result, SRAM cells used in space applications have become increasingly vulnerable to single-event upset (SEU) caused by the hars...
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| Principais autores: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
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MDPI AG
2025-06-01
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| coleção: | Applied Sciences |
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| Acesso em linha: | https://www.mdpi.com/2076-3417/15/12/6536 |
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